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Sliding-Wear Properties of Electro-Deposited Films with Cu and Pulse-Plated Ni Multi-Layers

机译:用Cu和脉冲镀Ni多层电沉积膜的滑动磨损性能

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The purpose of the present study is to investigate the effect of component layer geometry on wear resistance in multilayered structures consisting of soft Cu layers and hard nanocrystalline Ni layers, which were fabricated by electrodeposition. Pulsed-potentials were applied only during the nickel layer deposition to obtain the nanocrystalline Ni microstructure. We prepared the multilayers with various component layer thicknesses and various ratios of the Ni to Cu layer thicknesses. Pulse-plated nickel films without Cu layers were also prepared for comparison. The formation of nanostructured grains was recognized in the pulse-plated nickel using transmission electron microscopy (TEM). Among the multilayered films prepared in this study, the multilayer with the nanocrystalline nickel layers of 190nm thickness and the Cu layer of 10nm thickness revealed the best wear resistance. The weight-loss rate and the worn depth of this multilayered film were approximately half of those measured in the nanocrystalline nickel film without the Cu layers at the vertical loads of 10N and 20 N. These results suggest that the periodic insertion of thin Cu layers can improve the wear property of nanocrystalline nickel film.
机译:本研究的目的是研究组分层几何形状对由软铜层和硬纳米晶体Ni层组成的多层结构中的耐磨性的影响,所述软铜纳米晶体Ni层由电沉积制造。仅在镍层沉积期间施加脉冲电位,以获得纳米晶体Ni微结构。我们制备了具有各种组分层厚度和Ni的各种比率的多层厚度。还制备了没有Cu层的脉冲镀镍膜进行比较。使用透射电子显微镜(TEM)在脉冲镀镍中识别纳米结构晶粒。在本研究中制备的多层薄膜中,具有190nm厚度的纳米晶镍层的多层和10nm厚的Cu层显示出最佳耐磨性。该多层薄膜的减肥率和磨损深度约为在纳米晶镍膜中测量的那些的一半,而在垂直载荷10n和20n的垂直载荷处的Cu层。这些结果表明薄Cu层的周期性插入罐改善纳米晶镍薄膜的磨损性能。

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