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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Magnetic resonance tracking of fluorescent nanodiamond fabrication
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Magnetic resonance tracking of fluorescent nanodiamond fabrication

机译:荧光纳米金刚石制造的磁共振跟踪

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Magnetic resonance techniques (electron paramagnetic resonance (EPR) and nuclear magnetic resonance (NMR)) are used for tracking the multi-stage process of the fabrication of fluorescent nanodiamonds (NDs) produced by high-energy electron irradiation, annealing, and subsequent nano-milling. Pristine commercial high pressure and high temperature microdiamonds (MDs) with mean size 150 mu m contain similar to 5 x 10(18) spins/g of singlet (S = 1/2) substitutional nitrogen defects P1, as well as sp(3) C-C dangling bonds in the crystalline lattice. The half-field X-band EPR clearly shows (by the appearance of the intense 'forbidden' g = 4.26 line) that high-energy electron irradiation and annealing of MDs induce a large amount (similar to 5 x 10(17) spins/g) of triplet (S = 1) magnetic centers, which are identified as negatively charged nitrogen vacancy defects (NV-). This is supported by EPR observations of the 'allowed' transitions between Zeeman sublevels of the triplet state. After progressive milling of the fluorescent MDs down to an ultrasubmicron scale (<= 100 nm), the relative abundance of EPR active NV- defects in the resulting fluorescent NDs (FND) substantially decreases and, vice versa, the content of C-inherited singlet defects correlatively increases. In the fraction of the finest FNDs (mean particle size <20 nm), which are contained in the dried supernatant of ultracentrifuged aqueous dispersion of FNDs, the NV- content is found to be reduced by one order of magnitude whereas the singlet defects content increases up to similar to 2 x 10(19) spins/g. In addition, another triplet-type defect, which is characterized by the g = 4.00 'forbidden' line, appears. On reduction of the particle size below the 20 nm limit, the 'allowed' EPR lines become practically unobservable, whereas the 'forbidden' lines remain as a reliable fingerprint of the presence of NV- centers in small ND systems. The same size reduction causes the disappearance of the characteristic hyperfine satellites in the spectra of the P1 centers. We discuss the mechanisms that cause both the strong reduction of the peak intensity of the 'allowed' lines in EPR spectra of triplet defects and the transformation of the P1 spectra.
机译:磁共振技术(电子顺磁共振(EPR)和核磁共振(NMR))用于跟踪通过高能电子辐照,退火和随后的纳米级制造而制备的荧光纳米金刚石(ND)的多阶段过程。铣削。平均尺寸为150微米的原始商业高压和高温微金刚石(MD)包含与5 x 10(18)旋转/克单重态(S = 1/2)替代氮缺陷P1以及sp(3) CC晶格中的悬空键。半场X波段EPR清楚地表明(通过出现强烈的“禁止” g = 4.26线),高能电子辐照和MD的退火引起了大量的自旋(类似于5 x 10(17)自旋/ g)三重态(S = 1)磁中心,被确定为带负电荷的氮空位缺陷(NV-)。 EPR观察到三重态Zeeman子级之间的“允许”跃迁对此提供了支持。在将荧光MD逐步研磨至超亚微米级(<= 100 nm)后,所得荧光ND(FND)中的EPR活性NV-缺陷的相对丰度大大降低,反之亦然,C继承的单峰的含量缺陷相应地增加。在超离心FNDs水分散液的干燥上清液中所含的最细FNDs(平均粒径<20 nm)中,发现NV-含量降低了一个数量级,而单线态缺陷含量却增加了最高类似于2 x 10(19)spins / g。此外,还会出现另一个三重态缺陷,其特征是g = 4.00'禁止'线。在将粒径减小到20 nm极限以下时,“允许的” EPR线实际上变得不可观察,而“禁止的”线仍然是小型ND系统中存在NV中心的可靠指纹。相同的大小减小会导致P1中心光谱中的特征超精细卫星消失。我们讨论了导致三重态缺陷EPR谱中“允许”谱线的峰值强度大大降低以及P1谱转换的机制。

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