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Preparation and formation mechanism of smooth and uniform Cu_2O thin films by electrodeposition method

机译:电沉积法制备光滑均匀的Cu_2O薄膜及其形成机理

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Smooth and uniform Cu_2O thin films were prepared by electrodeposition on Sn-doped indium oxide substrates (ITO) in Cu(Ac)_2 electrolytes with thiourea addition. The influence of deposition potential and thiourea concentration on the formation of these thin films was investigated by using X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and atomic force microscopy (AFM). The results show that smooth and uniform Cu_2O thin films were achieved by electrodeposition under the potential of -0.1V (vs. SCE) with 0.5mM thiourea, which exhibited obvious absorbance and photocurrent response in visible light range. In addition, as the concentration of thiourea increased, the density of Cu_2O thin films decreased. Based on this, the thiourea assisted growth process was proposed as a plausible mechanism for the formation of smooth and uniform Cu_2O thin films.
机译:通过在添加硫脲的Cu(Ac)_2电解质中电沉积在Sn掺杂的氧化铟衬底(ITO)上,制备出光滑均匀的Cu_2O薄膜。使用X射线衍射(XRD),扫描电子显微镜(SEM),透射电子显微镜(TEM)和原子力显微镜(AFM)研究了沉积电位和硫脲浓度对这些薄膜形成的影响。结果表明,在0.5mM硫脲下,在-0.1V(vs. SCE)的电势下进行电沉积,可获得光滑均匀的Cu_2O薄膜,在可见光范围内具有明显的吸收和光电流响应。另外,随着硫脲浓度的增加,Cu_2O薄膜的密度降低。基于此,提出了硫脲辅助生长过程作为形成光滑均匀的Cu_2O薄膜的合理机制。

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