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Atomic layer deposition and chemical vapor deposition precursor selection method application to strontium and barium precursors

机译:原子层沉积和化学气相沉积前驱体选择方法在锶钡钡前驱体中的应用

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摘要

A new selection method for atomic layer deposition ( ALD) or chemical vapor deposition ( CVD) precursors is proposed and tested. Density functional theory was used to simulate Sr and Ba precursors, and several precursors were selected and used to grow films via ALD as test cases for the precursor selection method. The precursors studied were M( x) 2 ( M) Sr, Ba; x) tetramethylheptanedionate ( tmhd), acetylacetonate ( acac), hexafluoroacetylacetonate ( hfac), cyclopentadienyl ( H5C5), pentamethylcyclopentadienyl ( Me5C5), n- propyltetramethylcyclopentadienyl ( PrMe4C5), tris( isopropylcyclopentadienyl) ( Pr-3 iH(2)C(5)), tris( isopropylcyclopentadienyl)( THF) ( Pr3 iH2C5)( OC4H8), tris( isopropylcyclopentadienyl)( THF) 2 ( Pr3 iH2C5)( OC4H8) 2, tris( tert- butylcyclopentadienyl) ( Bu-3 tH(2)C(5)), tris( tert- butylcyclopentadienyl)( THF) ( Bu3 tH2C5)( OC4H8), heptafluoro2,2- dimethyl- 3,5- octanedionate ( fod)). The energy required to break bonds between the metal atom and the ligands was calculated to find which precursors react most readily. In the case of tmhd and Cp precursors, the energy required to break bonds in the precursor ligand was studied to evaluate the most likely mechanism of carbon incorporation into the film. Trends for Ba and Sr followed each other closely, reflecting the similar chemistry among alkaline earth metals. The diketonate precursors have stronger bonds to the metals than the Cp precursors, but weaker bonds within the ligand, explaining the carbon contamination found in experimentally grown films. Atomic layer deposition of SrO was tested with Sr( tmhd) 2 and Sr( PrMe4Cp) 2 and oxygen, ozone, and water as oxygen sources. No deposition was measured with tmhd precursors, and SrO films were deposited with PrMe4Cp with a source temperature of 200 degrees C and at substrate temperatures between 250 and 350 C with growth rates increasing for oxygen sources in this order: O-2 < H2O < O-2 + H2O. The experimental results support the predictions based upon calculations: PrMe4Cp and Me5Cp precursors are expected to be the best precursors among those studied for Ba and Sr film growth.
机译:提出并测试了一种用于原子层沉积(ALD)或化学气相沉积(CVD)前体的新选择方法。密度泛函理论用于模拟Sr和Ba的前驱体,选择了几种前驱体并通过ALD用于生长膜,作为前驱体选择方法的测试案例。研究的前体是M(x)2(M)Sr,Ba; x)四甲基庚二酸酯(tmhd),乙酰丙酮酸酯(acac),六氟乙酰丙酮酸酯(hfac),环戊二烯基(H5C5),五甲基环戊二烯基(Me5C5),正丙基四甲基环戊二烯基(PrMe4C5),三(异丙基环戊二烯基)2(C-3) ),三(异丙基环戊二烯基)(THF)(Pr3 iH2C5)(OC4H8),三(异丙基环戊二烯基)(THF)2(Pr3 iH2C5)(OC4H8)2,三(叔丁基环戊二烯基)(Bu-3 tH(2)C( 5)),三(叔丁基环戊二烯基)(THF)(Bu3 tH2C5)(OC4H8),七氟2,2-二甲基-3,5-辛二酸二乙酯(fod))。计算了打破金属原子与配体之间的键所需的能量,以找出最容易反应的前体。对于tmhd和Cp前体,研究了断裂前体配体中的键所需的能量,以评估碳掺入薄膜的最可能机理。钡和锶的趋势紧随其后,反映了碱土金属之间的化学相似。与Cp前体相比,二酮酸酯前体在金属上的结合力更强,但在配体中的结合力更弱,这说明在实验生长的薄膜中发现了碳污染。使用Sr(tmhd)2和Sr(PrMe4Cp)2以及氧气,臭氧和水作为氧气源,测试了SrO的原子层沉积。使用tmhd前驱物未测量到沉积,并且使用PrMe4Cp在源温度为200摄氏度且衬底温度为250至350摄氏度之间沉积了SrO膜,氧气源的生长速率按以下顺序增加:O-2

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