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首页> 外文期刊>Physical Review, B. Condensed Matter >Cascade overlap and amorphization in 3C-SiC: Defect accumulation, topological features, and disordering - art. no. 024106
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Cascade overlap and amorphization in 3C-SiC: Defect accumulation, topological features, and disordering - art. no. 024106

机译:3C-SiC中的级联重叠和非晶化:缺陷累积,拓扑特征和无序性-艺术。没有。 024106

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摘要

Molecular dynamics (MD) simulations with a modified Tersoff potential have been used to investigate cascade overlap, damage accumulation, and amorphization processes in 3C-SiC over dose levels comparable to experimental conditions. A large number of 10 keV displacement cascades were randomly generated in a model crystal to produce damage and cause amorphization. At low dose, the damage state is dominated by point defects and small clusters, where their concentration increases sigmoidally with increasing dose. The coalescence and growth of clusters at intermediate and higher doses is an important mechanism leading to amorphization in SiC. The homogeneous nucleation of small clusters at low dose underpins the homogeneouslike amorphization observed in SiC. A large increase in the number of antisite defects at higher dose indicates that both interstitials and antisite defects play an important role in producing high-energy states that lead to amorphization in SiC. The topologies (such as total pair correlation function, bond-angle, and bond-length distributions) of damage accumulation in the crystal suggest that a crystalline-to-amorphous (c-a) transition occurs at about 0.28 dpa. This value is in qualitative agreement with the experimental value of 0.27 dpa under similar irradiation conditions. After the model crystal transforms to the fully amorphous state, the long-range order is completely lost, while the short-range order parameter saturates at a value of about 0.49. [References: 43]
机译:具有改进的Tersoff势的分子动力学(MD)模拟已用于研究3C-SiC在与实验条件相当的剂量水平下的级联重叠,损伤积累和非晶化过程。在模型晶体中随机生成大量10 keV位移级联,以产生损伤并引起非晶化。在低剂量下,损伤状态主要由点缺陷和小簇组成,这些簇的浓度随剂量的增加而呈S形增加。中高剂量时簇的聚结和生长是导致SiC非晶化的重要机制。低剂量下小团簇的均匀成核作用增强了SiC中观察到的均匀无定形。高剂量下抗位缺陷数量的大量增加表明,间隙和抗位缺陷在产生高能态(导致SiC非晶化)中都起着重要作用。晶体中损伤累积的拓扑结构(例如总对相关函数,键角和键长分布)表明,晶体到非晶(c-a)的转变发生在大约0.28 dpa处。在类似的照射条件下,该值与0.27 dpa的实验值在质量上一致。在模型晶体转换为完全非晶态后,长程有序完全丢失,而短程有序参数以约0.49的值饱和。 [参考:43]

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