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Fast bi-exponential fluorescence lifetime imaging analysis methods

机译:快速双指数荧光寿命成像分析方法

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摘要

A new hardware-friendly bi-exponential fluorescence lifetime imaging (FLIM) algorithm has been proposed. Compared to conventional FLIM software, the proposed algorithms are noniterative offering direct calculation of lifetimes and therefore suitable for real-time applications. They are applicable to single-channel or 2D multichannel time-correlated single-photon counting (TCSPC) systems. The proposed methods have been tested on both synthesized and realistic FLIM data, and we have compared their performances with other recently proposed nonfitting bi-exponential techniques showing promising applications in future massive solid-state TCSPC imagers. (C) 2015 Optical Society of America
机译:提出了一种新的硬件友好的双指数荧光寿命成像(FLIM)算法。与传统的FLIM软件相比,本文提出的算法是非迭代的,可直接计算寿命,因此适用于实时应用。它们适用于单通道或2D多通道时间相关的单光子计数(TCSPC)系统。所提出的方法已经在合成FLIM数据和真实FLIM数据上进行了测试,我们将它们的性能与其他最近提出的非拟合双指数技术进行了比较,这些技术在未来的大型固态TCSPC成像仪中显示出了有希望的应用。 (C)2015年美国眼镜学会

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