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首页> 外文期刊>Optics Letters >Improving weak-signal identification via predetection background suppression by a pixel-level, surface-wave enabled dark-field aperture
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Improving weak-signal identification via predetection background suppression by a pixel-level, surface-wave enabled dark-field aperture

机译:通过像素级,启用表面波的暗场光圈通过预检测背景抑制来改善弱信号识别

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摘要

We report the successful implementation of a surface-wave enabled dark-field aperture (SWEDA) directly on a complementary metal-oxide semiconductor sensor pixel (2.2 (mu)m). This SWEDA pixel allows predetection cancellation of a uniform coherent background. We show that the signal-to-noise ratio (SNR) of the SWEDA pixel is better than that of a single undressed pixel over a significant range of signal-to-background ratio (SBR). For a small SBR value (SBR velence 0.001, background intensity velence 3.96 W/m~(2), integration time velence 5 ms), we further demonstrate that a SWEDA pixel can detect a weak localized signal buried in a high background, while conventional postdetection background subtraction cannot (improved SNR velence 2.2 versus SNR velence 0.26).
机译:我们报道了直接在互补金属氧化物半导体传感器像素(2.2μm)上成功实现表面波暗场孔径(SWEDA)的实现。该SWEDA像素允许对统一的相干背景进行预检测消除。我们显示,在很大的信噪比(SBR)范围内,SWEDA像素的信噪比(SNR)优于单个未修饰像素的信噪比。对于较小的SBR值(SBR速率0.001,背景强度速率3.96 W / m〜(2),积分时间速率5 ms),我们进一步证明了SWEDA像素可以检测到隐藏在高背景中的微弱局部信号,而传统检测后背景减法不能实现(SNR velence 2.2与SNR velence 0.26相比有所提高)。

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