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Crack-Release Transfer Method of Wafer-Scale Grown Graphene Onto Large-Area Substrates

机译:晶圆级生长石墨烯在大面积基板上的裂纹释放转移方法

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We developed a crack-release graphene transfer technique for opening up possibilities for the fabrication of graphene-based devices. Graphene film grown on metal catalysts/SiO2/Si wafer should be scathelessly peeled for sequent transferring to a target substrate. However, when the graphene is grown on the metal catalyst on a silicon substrate, there is a large tensile stress resulting from the difference of the coefficient of thermal expansion in the catalyst and silicon. The conventional methods of detaching graphene from metal catalysts were found to induce considerable mechanical damage on graphene films during separation processes including metal wet etching. Here we report a new technique wherein bubbles generated by electrolysis reaction separate thin metal catalysts from the SiO2/ Si wafer. The dry attachment of graphene to the target wafer was processed utilizing a wafer to wafer bonding technique in a vacuum. We measured the microscopic image, Raman spectra, and electrical properties of the transferred graphene. The optical and electrical properties of the graphene transferred by the bubbles/dry method are better than those of the graphene obtained by mechanical/wet transfer.
机译:我们开发了裂纹释放石墨烯转移技术,为制造基于石墨烯的器件开辟了可能性。在金属催化剂/ SiO2 / Si晶片上生长的石墨烯膜应被认真剥离,以随后转移到目标衬底上。然而,当石墨烯在硅衬底上的金属催化剂上生长时,由于催化剂和硅中的热膨胀系数的差异而导致大的拉伸应力。发现从金属催化剂分离石墨烯的常规方法在包括金属湿法刻蚀的分离过程中对石墨烯膜引起相当大的机械损伤。在这里,我们报道了一种新技术,其中通过电解反应产生的气泡将薄金属催化剂与SiO2 / Si晶片分开。石墨烯在目标晶片上的干附着是在真空中利用晶片到晶片的键合技术进行的。我们测量了转移的石墨烯的显微图像,拉曼光谱和电性能。通过气泡/干法转移的石墨烯的光学和电学性能优于通过机械/湿转移获得的石墨烯的光学和电学性能。

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