The measurement system for adjacent electromagnetic field distributions of actual IC and printed circuit board by using the 3-inputs signal phase difference measurement system and a small size sensor

摘要

The measurement system for adjacent electromagnetic field distributions was developed by using the 3-inputs signal phase measurement system. It has wide applicability than the measurement system by using a vector signal analyzer. This measurement system can measure phase difference of the signal which change its frequency or phase by time. Therefore, the adjacent electromagnetic field distribution of an actual IC and a printed circuit board can be measured by this system. This paper describes changes of adjacent electromagnetic field on the actual printed circuit board with or without EMI countermeasure component. Also, adjacent electromagnetic field distributions over 1GHz are described in this paper. These examples show that this measurement system is useful for analyzing EMC problems.