Ultrafast imaging interferometry at femtosecond-laser-excited surfaces

摘要

A simple and robust setup for femtosecond time-resolved imaging interferometry of surfaces is described. The apparatus is capable of measuring both very small phase shifts (similar to 3 x 10(-2) rad) and amplitude changes (similar to 1%) with micrometer spatial resolution (similar to 1 mu m). Interferograms are processed using a 2D-Fourier transform algorithm. We discuss the image formation and the physical interpretation of the measured interferograms. The technique is applied to measure transient changes of a GaAs surface irradiated with intense femtosecond laser pulses with fluences near the ablation threshold. (c) 2006 Optical Society of America.