首页> 外文期刊>Journal of the Instrument Society of India: Proceedings of the national symposium on instrumentation >Physical properties of indium Tin oxide films prepared by DC reactive magnetron sputtering at different oxygen pressures
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Physical properties of indium Tin oxide films prepared by DC reactive magnetron sputtering at different oxygen pressures

机译:直流反应磁控溅射在不同氧压下制备的铟锡氧化物薄膜的物理性能

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摘要

Transparent conducting indium tin oxide films were prepared by reactive sputtering of metallic indium (90 at %)-tin (10 at %) alloy target using dc reactive magnetron sputtering technique at various oxygen pressures in the range 5 × 10{sup}5 - 1 × 10{sup}3 mbar on glass substrates held at a temperature of 673 K. The influence of oxygen pressure on the electrical and optical properties of the films was systematically studied. Films with low electrical resistivity of 4 × 10{sup}4 ohm-cm and high optical transmittance of 88 % was obtained at an optimum oxygen pressure of 1 × 10{sup}4 mbar.
机译:通过使用直流反应磁控溅射技术在5×10 {sup} 5-1范围内的各种氧气压力下对金属铟(90 at%)-锡(10 at%)合金靶进行反应溅射,制备了透明导电铟锡氧化物膜。保持在673 K温度下的玻璃基板上的×10 {sup} 3 mbar。系统地研究了氧气压力对薄膜电学和光学性质的影响。在最佳氧气压力为1×10 {4}毫巴的情况下,获得了具有4×10 6 ohm-cm的低电阻率和88%的高透光率的薄膜。

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