Scanning SQUID Microscope NDT System Based on Eddy Current Testing

摘要

A scanning SQUID microscope based on HTS dc SQUID has been developed. The SQUID is mounted inside the insulation vacuum of a cryostat, which is separated from room temperature samples by a 65μm thick sapphire window. Operating with a double-D exciting coil, it could be assembled to a scanning SQUID microscope Nondestructive Testing (NDT) system based on eddy current testing. The current is excited by an appropriate sinusoidal alternating (double-D coil) current in the conducting material, and then it induces a corresponding magnetic field. The vertical component of the field is then detected by the scanning SQUID system. The distortion of the field could be detected at the regions of discontinuities, such as flaws. Thereby, the defects inside the materials will be detected with neither contact nor destruction.