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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >THE DEPENDENCES OF ESR LINE WIDTHS AND SPIN-SPIN RELAXATION TIMES OF SINGLE NITROGEN DEFECTS ON THE CONCENTRATION OF NITROGEN DEFECTS IN DIAMOND
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THE DEPENDENCES OF ESR LINE WIDTHS AND SPIN-SPIN RELAXATION TIMES OF SINGLE NITROGEN DEFECTS ON THE CONCENTRATION OF NITROGEN DEFECTS IN DIAMOND

机译:单氮缺陷的ESR线宽度和自旋自旋弛豫时间与金刚石中氮缺陷浓度的关系

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摘要

Line widths and spin-spin relaxation times of P1 centres in synthetic Ib and natural la diamonds with concentrations of P1 and P2 centres covering the range 0.03-400 atomic parts per million have been measured. At concentrations higher than about ten atomic parts per million the line width is linearly dependent on the concentration. At lower concentrations the electron-C-13 dipolar contribution to the line width dominates and the width of the line remains constant. Since the pulse sequence employed for T-2 measurements eliminates the effects of inhomogeneous line broadening, T-2(-1) of the m(I) = 0 line remains linearly dependent on the total paramagnetic impurity concentration, even at very low paramagnetic impurity concentrations. [References: 8]
机译:已测量了合成Ib和天然La钻石中P1中心的线宽和自旋自旋弛豫时间,其P1和P2中心的浓度范围为百万分之0.03-400原子。当浓度高于百万分之十左右时,线宽与浓度成线性关系。在较低的浓度下,电子-C-13偶极对线宽的贡献占主导,并且线宽保持恒定。由于用于T-2测量的脉冲序列消除了不均匀线展宽的影响,因此即使在非常低的顺磁杂质下,m(I)= 0线的T-2(-1)仍线性依赖于总顺磁杂质浓度浓度。 [参考:8]

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