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首页> 外文期刊>Journal of nanoscience and nanotechnology >Effects of Post Thermal Annealing on the Electrical Properties of Vertical Type Organic Thin Film Transistors Using Poly(3-hexylthiophene) and Its Application in Organic Light Emitting Transistor
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Effects of Post Thermal Annealing on the Electrical Properties of Vertical Type Organic Thin Film Transistors Using Poly(3-hexylthiophene) and Its Application in Organic Light Emitting Transistor

机译:热退火对聚(3-己基噻吩)垂直型有机薄膜晶体管电学特性的影响及其在有机发光晶体管中的应用

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摘要

We have fabricated the vertical type organic thin film transistor (OTFT) using electrically conductive poly(3-hexylthiophene) (P3HT) as a p-type organic material. Effects of post thermal annealing and thickness of active layer on the performance of vertical type transistors were investigated. Especially, the correlation between carrier mobility of P3HT after post thermal annealing and static characteristics of the transistor was studied. Carrier mobility was calculated by space charge limited current (SCLC) model from the I-V curves of the prepared device. The vertical type OTFT after post thermal annealing at 120℃(T{sub}g) showed high current of 0.383 mA and on-off ratio of 22.5 at a low gate voltage of +2.0 V. Additionally, we report on emission characteristics from the vertical type transistor using P3HT.
机译:我们使用导电聚(3-己基噻吩)(P3HT)作为p型有机材料制造了垂直型有机薄膜晶体管(OTFT)。研究了后热退火和有源层厚度对垂直型晶体管性能的影响。特别地,研究了后退火后P3HT的载流子迁移率与晶体管的静态特性之间的相关性。载流子迁移率是根据所制备器件的I-V曲线通过空间电荷限制电流(SCLC)模型计算的。垂直型OTFT在120℃(T {sub} g)后热退火后,在+2.0 V的低栅极电压下显示出0.383 mA的高电流和22.5的开关比。此外,我们还报道了使用P3HT的垂直型晶体管。

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