Effects of autoionising states on the single and double ionisation yields of neon with soft X-ray fields

摘要

In this work, single and double ionisation yields of neon under extreme ultraviolet free-electron laser (FEL) radiation tuned in the vicinity of the autoionising states (AIS) of Ne~+ were studied. Density matrix equations were developed and were used to calculate the dependence of the branching ratios of singly and doubly ionised neon on the field intensity and its duration. In addition, in response to a recent experiment [M. Martins et al., Phys. Rev. A 2011, 80, 023411], a quantitative analysis was undertaken in order to reproduce the magnitude of the branching ratios by varying the FEL photon frequency in the range 41.0-42.0 eV in accordance with the experimental report. While the reported variations of the species' branching ratios as a function of the FEL field's photon energy were found, their magnitude and shape differ. In general, the branching ratios are found to be heavily dependent on the given combination of the peak intensity and the pulse duration. Furthermore, the FEL's stochastic fluctuation has been modelled by solving the average density matrix equations and it was found that stochastic effects should also affect branching ratios, mainly due to the increase in the effective bandwidth of the pulse in comparison with the AIS's decay ionisation width. Our calculations suggest that field fluctuations generally diminish the resonance features of the branching ratios.