首页> 外文期刊>Journal of Materials Processing Technology >Acoustic emission monitoring for the diamond machining of oxygen-free high-conductivity copper
【24h】

Acoustic emission monitoring for the diamond machining of oxygen-free high-conductivity copper

机译:用于无氧高导电铜的金刚石加工的声发射监测

获取原文
获取原文并翻译 | 示例
           

摘要

The fabrication of high-quality optical lenses and reflectors demands the ultraprecision cutting of materials using micron to submicron uncut chip thicknesses (a{sub}c). At this scale, surface topography is influenced significantly by the interaction between the cutting tool and grain orientation and boundary effects. In the past, several researchers verified this effect using techniques and sensors such as scanning electron microscopy (SEM) and force sensors. In this study, micro-scratching tests on coarse-grained, oxygen-free high-conductivity (OFHC) copper were performed using both increasing and constant depths of cut. The topography of the surfaces was characterized and verified using SEM and optical microscopy after micro-etching of the workpiece. Acoustic emission (AE) was used to explore the grain orientation and grain boundary effect in the precision cutting process. Due to its high signal-to-noise ratio at very low depths of cut, AE is a leading sensing technology for monitoring precision machining processes. In this investigation, differences in material properties such as change in grain orientation and grain boundary crossing are monitored during diamond cutting of OFHC copper using AE sensing. The results show that AF has excellent sensitivity and can indicate the local change in material characteristics.
机译:高质量光学透镜和反射镜的制造要求使用微米至亚微米的未切割芯片厚度(a {sub} c)进行材料的超精密切割。在这种规模下,切削刀具与晶粒取向和边界效应之间的相互作用会显着影响表面形貌。过去,一些研究人员使用诸如扫描电子显微镜(SEM)和力传感器之类的技术和传感器来验证这种效果。在这项研究中,使用增加的切削深度和恒定的切削深度对粗晶粒无氧高导电性(OFHC)铜进行了微划痕测试。在对工件进行微蚀刻后,使用SEM和光学显微镜对表面的形貌进行表征和验证。声发射(AE)用于研究精密切削过程中的晶粒取向和晶界效应。由于其在极低的切削深度下具有很高的信噪比,因此AE是用于监控精密加工过程的领先传感技术。在这项研究中,使用AE感应对OFHC铜进行金刚石切割时,可以监测材料性能的差异,例如晶粒取向的变化和晶界的交叉。结果表明,AF具有出色的灵敏度,可以指示材料特性的局部变化。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号