Thin film of bis(ethylenedithio)-tetrathiafulvalene radical salt with Dawson polyoxometalate

摘要

The thin film of bis(ethylenedithio)-tetrathiafulvalene (BEDT-TTF or ET) radical salt with Dawson polyoxometalate [P{sub}2W{sub}18O{sub}62]{sup}(6-) was prepared on gold substrate by using electrochemical process. The film was characterized by Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), electron spin resonance spectroscopy (ESR) and cyclic voltammetry (CV). Scanning electron microscope (SEM) micrograph of the film exhibits a smooth and uniform surface layer containing micronic grains. The thickness of the film estimated by SEM is ca. 22μm. The film exhibits semiconducting behavior with a room-temperature conductivity 6.5×10{sup}(-3) Scm{sup}(-1).