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XRD and FTIR characterization of nanocrystalline YVO_4: Eu derived by co-precipitation process

机译:共沉淀法制备纳米晶YVO_4:Eu的XRD和FTIR表征

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Nanosized YVO_4 powders doped with Eu~(3+) were synthesized through a co-precipitation process. The influence of annealing temperature on the microstructural features was investigated by X-ray powder diffraction (XRD) and Fourier Transform Infrared spectroscopy (FTIR). Nanocrystalline YVO_4 phase is obtained just after the precipitation process without thermal treatment. The integral breadth approach based on Williamson-Hall plots was used for analysis of XRD line broadening. By this simple method, a dramatic increase of apparent the size of coherently diffracting domains is evidenced when the temperature of thermal treatment is increased from about 500 to 600℃. XRD data were compared with the annealing temperature behaviour of FTIR absorption bands corresponding to the VO_4 group.
机译:通过共沉淀法合成了掺有Eu〜(3+)的纳米YVO_4粉末。通过X射线粉末衍射(XRD)和傅里叶变换红外光谱(FTIR)研究了退火温度对显微组织特征的影响。沉淀过程后无需热处理即可获得纳米晶YVO_4相。基于Williamson-Hall图的积分宽度方法用于XRD线展宽分析。通过这种简单的方法,当热处理温度从约500℃提高到600℃时,相干衍射域的表观尺寸明显增加。将XRD数据与对应于VO_4基团的FTIR吸收带的退火温度行为进行比较。

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