Impact of dislocation cell elastic strain variations on line profiles from deformed copper

摘要

Energy scanned, sub-micrometer X-ray beams were used to obtain diffraction line profiles from individual dislocation cells in copper single crystals deformed in compression. Sub-micrometer depth resolution was provided by translating a wire through the diffracted beams and using triangulation to determine the depths of the diffracting volumes. Connec-tion to classic volume-averaged results was made by adding the line profiles from 52 spa- El tially resolved dislocation cell measurements. The resulting sub profile is smooth and sym- metric, in agreement with early assumptions; the mean strain and full width half maximum E7- are consistent with the average of the parameters extracted from the more exact individual dislocation cell measurements.