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Preparation and characterization of films based on zirconium sulfophenyl phosphonate and chitosan

机译:基于磺基苯基膦酸锆和壳聚糖的薄膜的制备与表征

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摘要

Zirconium sulfophenyl phosphonate (ZrSP), Zr(O3P-C6H4SO3H)(2), was synthesized and characterized to prepare nanocomposites based on chitosan (CS). The effects of ZrSP on the structure, morphology, and thermal properties, as well as the mechanical properties of the films were investigated by Fourier-transform infrared spectroscopy (MR), thermal gravimetric analysis (TGA), differential scanning calorimetry (DSC), X-ray diffraction (XRD), scanning electron microscopy (SEM), and tensile tests. FTIR spectroscopy revealed that electrostatic interactions had been formed in the nanocomposites, which improved the compatibility between CS and ZrSP. XRD and SEM results indicated the ZrSP nanoparticles were uniformly distributed in the chitosan matrix at low loading, and obvious aggregations existed at high loading. In addition, compared with neat CS, the values of tensile strength (sigma(b)), elongation at break (epsilon(b)), and water resistance of CS/ZrSP-3 containing 0.6 wt % ZrSP had been improved by 60.0%. 69.7%, and 41.8%, respectively. (
机译:合成并表征了磺基苯基膦酸锆锆(ZrSP)Zr(O3P-C6H4SO3H)(2),以制备基于壳聚糖(CS)的纳米复合材料。通过傅里叶变换红外光谱(MR),热重分析(TGA),差示扫描量热法(DSC),X研究了ZrSP对膜的结构,形态和热性能以及机械性能的影响。射线衍射(XRD),扫描电子显微镜(SEM)和拉伸试验。 FTIR光谱表明,在纳米复合材料中已形成静电相互作用,从而改善了CS和ZrSP之间的相容性。 XRD和SEM结果表明,ZrSP纳米粒子在低负荷下均匀分布在壳聚糖基质中,高负荷下存在明显的聚集。此外,与纯CS相比,含有0.6 wt%ZrSP的CS / ZrSP-3的拉伸强度(sigma(b)),断裂伸长率(ε(b))和耐水性的值提高了60.0% 。分别为69.7%和41.8%。 (

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