The transistor and energy-dispersive x-ray spectrometry: roots and milestones in x-ray analysis

摘要

The story of energy-dispersive x-ray spectrometry was preceded by a long evolutionary history of solid-state physics and semiconductor electronics. The beginning may be said to have been with the recognition of the special properties of rectifying crystals. We follow this story from its roots through recent innovations that point the way to the future of this method of chemical analysis. Published in 2001 by John Wiley & Sons, Ltd. [References: 72]