Measurements of the surface ionization in multilayered specimens

摘要

Results from experimental measurements of surface ionization, Phi(0), from multilayered specimens are presented. The studied samples consisted of Cu and C layers of different thicknesses, deposited on single-element substrates that cover the periodic system, from Be to Bi. The surface ionization was determined by the tracer method, i.e. by measuring the characteristic x-ray intensity emitted from an ultra-thin tracer layer deposited on the multilayer structure and, according to Castaing's definition, dividing it by the x-ray intensity from an equivalent, self-supporting tracer layer. The considered tracer element was Ni, and measurements were performed for Ni Kalpha and Ni La x-rays. Experimental results are compared with Monte Carlo simulation results generated by using the general-purpose simulation package PENELOPE with ionization cross-sections computed from an optical-data model. Measured data are also compared with the predictions of an empirical analytical expression for Phi(0), which was derived from systematic Monte Carlo simulations. Copyright (C) 2004 John Wiley Sons, Ltd.