Algorithm of fundamental parameters for the SEICXRF method

摘要

An algorithm based on fundamental parameters and applied to the SEICXRF method, developed by one of the authors, is presented. The methodology used in the calculation is similar to the Rousseau fundamental parameters method, but the main difference is the considerations about the x-ray secondary fluorescence. In the new experimental method, the fluorescence yield by photons corresponding to the absorption edges with energies greater than the absorption edge energy of analyte does not occur. This secondary fluorescence appears in the calculation of the total fluorescence as a consequence of the integral count of the fluorescent emission from the sample. It is created by the primary fluorescence yield of the atoms whose absorption edge energies are less than the primary fluorescence energy of the analyte. The algorithm also considers the effect of the decrease of the sample fluorescent background just at the jump, originated by the change of the absorption coefficient at the absorption edge energy of the element of interest. Considering these two effects, including the primary fluorescence in the calculation, allows one to obtain the net fluorescence originated by the analyte at its own absorption edge. Copyright (C) 2003 John Wiley Sons, Ltd. [References: 13]