Application of X-ray fluorescence spectrometry on quality control of scintillation crystals

摘要

Themajor components PbO and WO_3 inPWOcrystals, Bi_2O_3 and GeO_2 in BGO crystals, aswell as Gd, La, Nb, Mg, Mo, Bi, Sb and Y doped in PWO crystals and Eu doped in BGO crystals were successfully determined with X-ray fluorescence spectroscopy (XRF) using fusion techniques. Calibration standards were synthesized with high-purity oxides and standard solutions. The analysis results can meet the general requirements of the quality control of the crystal growth and research purpose. The relative standard deviations for Bi_2O_3, GeO_2, PbO and WO_3 are 0.21%, 0.18%, 0.25% and 0.22%, respectively (k = 8). The detection limits for dopants in PWO are below 5 μg/g for Gd, La, Nb, Mo, Sb and Y and below 20 μg/g for Mg and Bi. The detection limits for Eu doped in BGO are 8 μg/g. The testing results of XRF were compared with those of inductively coupled plasma optical emission spectroscopy. It was found that the relative differences of the testing results between the two methods are less than 10% formost dopants in PWO crystals.