首页> 外文期刊>Transactions of the Magnetics Society of Japan >Magnetization Behavior of Synthetic Antiferromagnet and Toggle-Magnetoresistance Random Access Memory
【24h】

Magnetization Behavior of Synthetic Antiferromagnet and Toggle-Magnetoresistance Random Access Memory

机译:合成反铁磁体的磁化行为和拨磁电阻随机存取存储器

获取原文
获取原文并翻译 | 示例
           

摘要

The magnetization behavior of antiferromagnetically coupled ferromagnetic bilayers with a uniaxial anisotropy is investigated analytically, with the aid of numeric calculation. Field trajectories giving a constant angle to the magnetization of one of the two layers, leaving the other as a variable in the in-plane field two-dimensional co-ordinate, and their envelopes are used to understand the magnetization behavior, including switching. These tools provide a good means of optimizing magnetic parameters to maximize the operating field margins of the recently proposed toggle-mode MRAM devices, including the thermal relaxation. Control of the especially low exchange coupling required for performance optimization is identified as a key technical issue, as well as increase of the operating field strength.
机译:借助数值计算,对具有单轴各向异性的反铁磁耦合铁磁双层的磁化行为进行了分析研究。磁场轨迹使两层中的一层的磁化强度保持恒定角度,而另一层在面内磁场二维坐标中保留为变量,它们的包络用于了解磁化行为,包括切换。这些工具为优化磁参数提供了一种很好的手段,可以使最近提出的触发模式MRAM器件的工作场余量最大化,包括热弛豫。控制性能优化所需的特别低的交换耦合被认为是关键的技术问题,并且增加了工作磁场强度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号