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首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Progress toward Producing n-Type CdSe Quantum Dots: Tin and Indium Doped CdSe Quantum Dots
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Progress toward Producing n-Type CdSe Quantum Dots: Tin and Indium Doped CdSe Quantum Dots

机译:制备n型CdSe量子点的进展:锡和铟掺杂的CdSe量子点

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Controlling conductivity via doping in semiconductor quantum dots is an important part of nanoparticle research. In this report, doping of CdSe quantum dots with indium and tin is explored. High-resolution nanoprobing confirms the presence of indium and tin in the particles and the inclusion of indium into the particles without forming a separate phase. The tin doped CdSe samples show preferential adsorption of tin in quantum dots from the solution during synthesis while incorporation of indium is somewhat statistical. In agreement with the expected n-type behavior, the photoluminescence (PL) of both indium and tin doped samples exhibits a significantly steeper temperature dependence, compared to undoped CdSe quantum dots. Comparison of theory and experimental data suggests that the approximate locations of the dopants levels are at 280 and 100 meV below the conduction band edge of the indium and tin doped quantum dots, respectively. The relative temperature dependent Stokes shifts of the doped samples are larger than those of the undoped sample, suggesting that the electron is backfilling the lowest unoccupied quantum dots levels. The oxidized doped samples exhibit increased polarized band-edge emission. The likely explanation of the polarized emission is that trapping times are fast in the oxidized doped samples compared to the undoped samples.
机译:通过掺杂半导体量子点来控制电导率是纳米颗粒研究的重要组成部分。在本报告中,研究了用铟和锡掺杂CdSe量子点。高分辨率纳米探测证实了颗粒中铟和锡的存在以及铟在颗粒中的夹杂而没有形成单独的相。锡掺杂的CdSe样品显示出在合成过程中锡优先吸附在溶液中的量子点中,而铟的掺入则有些统计。与预期的n型行为一致,与未掺杂的CdSe量子点相比,铟和锡掺杂样品的光致发光(PL)表现出明显更陡的温度依赖性。理论和实验数据的比较表明,掺杂剂能级的大约位置分别在铟和锡掺杂量子点的导带边缘以下280和100 meV处。掺杂样品的相对温度相关斯托克斯位移大于未掺杂样品的斯托克斯位移,表明电子正在回填最低的未占据量子点水平。氧化的掺杂样品表现出增加的极化带边缘发射。极化发射的可能解释是,与未掺杂样品相比,氧化掺杂样品中的俘获时间快。

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