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首页> 外文期刊>The Journal of Chemical Physics >Dielectric relaxation of water and heavy water in the whole fluid phase
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Dielectric relaxation of water and heavy water in the whole fluid phase

机译:在整个液相中水和重水的介电弛豫

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Recently we developed a new microwave spectroscopy technique in the frequency range up to 40 GHz, and measured the static dielectric constant and the dielectric relaxation time for supercritical water. In the present work we report the dielectric properties of heavy water at temperatures and pressures up to 770 K and 59 MPa, respectively. The static dielectric constant of D_2O as well as H_2O are well described by the Uematsu-Franck formula when the number density instead of the mass density is used as the input parameter. The dielectric relaxation time decreases rapidly with increasing temperature in liquid H_2O and D_2O and jumps to a large value at the liquid-gas transition. The relaxation time of D_2O is longer than that of H_2O in the liquid state, and the difference becomes smaller with decreasing density in the gaseous state. For both H_2O and D_2O the most relevant parameter determining the relaxation time is the temperature at high densities or at low temperatures, and it is the density at low densities or at high temperatures. Based upon the observation that the dielectric relaxation time becomes fairly long in the dilute limit, we have concluded that the dielectric relaxation in the gaseous state is governed by the binary collision of water molecules and explained the relaxation time quantitatively by the collision time. We have extended the interpretation of the dielectric relaxation to the liquid state by taking into account the contribution of bound water molecules that are incorporated in the hydrogen-bond network. Anomalous relaxation at low temperatures is also discussed.
机译:最近,我们开发了一种新的微波光谱技术,其频率范围高达40 GHz,并测量了超临界水的静态介电常数和介电弛豫时间。在本工作中,我们分别报告了重水在高达770 K和59 MPa的温度和压力下的介电性能。当使用数字密度而不是质量密度作为输入参数时,Uematsu-Franck公式很好地描述了D_2O和H_2O的静态介电常数。介电弛豫时间随液体H_2O和D_2O中温度的升高而迅速减小,并在液-气转变时跃升至较大值。 D_2O的弛豫时间比液态的H_2O的弛豫时间长,并且随着气态密度的降低,差减小。对于H_2O和D_2O而言,确定弛豫时间的最相关参数是高密度或低温下的温度,它是低密度或高温下的密度。基于在稀释极限内介电弛豫时间变得相当长的观察,我们得出结论,气态的介电弛豫受水分子的二元碰撞支配,并且由碰撞时间定量地解释了弛豫时间。考虑到结合在氢键网络中的结合水分子的作用,我们将介电弛豫的解释扩展到了液态。还讨论了低温下的异常松弛。

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