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首页> 外文期刊>The International Journal of Advanced Manufacturing Technology >Novel method to remove tall diamond grits and improve diamond disk performance
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Novel method to remove tall diamond grits and improve diamond disk performance

机译:去除高金刚石砂粒并改善金刚石盘性能的新方法

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摘要

A diamond disk is indispensable to dressing chemical mechanical planarization (CMP) polishing pads. Current CMP diamond disks contain numerous diamond grits (approximately 10,000-25,000) on the flat surface of a metal substrate. Although a diamond disk has a regular distribution of grits on its surface, their tips are not of uniform height. Hence, only a small proportion of the grits can penetrate the flexible pad surface, and a large number of grits remain unused on the disk. In this work, we developed a novel technique to find and remove tall diamond grits on a diamond disk to improve the leveling of the diamond tips and increase the number of working grits. We examined an original diamond disk and disks in which three, five, and seven tall diamond grits were removed. We then evaluated the surface characteristics and pad dressing rates (PDRs) as well as the removal rate for a dielectric oxide film dressed with these diamond disks after the removal of the tall grits. We compared the results with those obtained for the original diamond disk. The removal of the tall diamond grits facilitated diamond leveling and helped increase the number of working grits. The PDR decreased as the number of tall grits removed increased. The experimental results revealed that, after the removal of the tall grits, the diamond disk exhibited better non-uniformity and a lower pad consumption rate without damaging the local circuitry. In addition, the lifetime of the pad and disk was prolonged, which should lower the cost of the CMP process.
机译:金刚石盘对于修整化学机械平面化(CMP)抛光垫是必不可少的。当前的CMP金刚石盘在金属基材的平坦表面上包含许多金刚石砂粒(大约10,000-25,000)。尽管金刚石盘在其表面上具有规则的磨粒分布,但是它们的尖端不是均匀的高度。因此,只有一小部分的砂砾可以穿透柔性垫表面,并且大量的砂砾仍未使用在盘上。在这项工作中,我们开发了一种新颖的技术来发现并去除金刚石盘上的高金刚石砂粒,从而改善了金刚石尖端的水平度并增加了工作砂粒的数量。我们检查了原始的金刚石磨片,并去除了三个,五个和七个高的金刚石磨片。然后,我们评估了去除粗砂粒后的表面特性和垫修整率(PDR)以及用这些金刚石圆盘修整的介电氧化物膜的去除率。我们将结果与原始钻石盘获得的结果进行了比较。去除较高的金刚石砂粒有助于金刚石整平并有助于增加工作砂粒的数量。随着去除的高粗粒数量的增加,PDR下降。实验结果表明,去除粗大的沙粒后,金刚石盘表现出更好的不均匀性和较低的垫消耗率,而不会损坏局部电路。另外,垫和盘的寿命被延长,这将降低CMP工艺的成本。

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