Addressing 0.13 μm Yield Management Issues

摘要

Tom Long, v.p. of corporate marketing at KLA-Tencor Corp. (San Jose), joined the company in 1991 as v.p. and general manager of its reticle inspection division. Previously, Long held managerial positions in wafer fab and yield management at LSI, Synertek, Philips Semiconductor and Fairchild Semiconductor.