A lain Diebold is an Empire Innovation Professor of nanoscale science at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany, and the executive director of CNSE's Center for Nanoscale Metrology. His research focuses on the impact of nanoscale dimensions on materials' physical properties, and he is very active in the area of nanoelec-tronics metrology. He is a member of the International Metrology Technical Working Group, founder and co-chair of the U.S. Metrology Technical Working Group for the 2008 International Technology Roadmap for Semiconductors (ITRS), and chair of the Manufacturing Science and Technology Group of the American Vacuum Society. Following are highlights from this month's podcast: SI: What challenges do you see as metrology goes deeper into nanoscale?
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