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首页> 外文期刊>Science of advanced materials >Thickness-Dependence of Surface Reconstruction on the (001) Surface of Ultrathin Silicon Nanosheets by Density Functional Tight Binding Simulations
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Thickness-Dependence of Surface Reconstruction on the (001) Surface of Ultrathin Silicon Nanosheets by Density Functional Tight Binding Simulations

机译:通过密度泛函紧密粘合模拟厚度依赖性表面重建对超硅纳米晶圆的(001)表面的依赖性

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摘要

The influences of the thickness of ultrathin Si nanosheets on the (001) surface morphologies and charge distribution were identified by using density functional tight binding (DFTB) simulations. The differences in structure and electronic properties were elucidated on the basis of bond lengths, bond angle distribution, and arrangement patterns in ( 001) surface atoms of Si nanosheets with their thickness decreasing from 1.5 nm to 0.4 nm. The surface atoms in some nanosheets present perfect zig-zag patterns in their dimers. The amounts of the trimers are far less than those of the dimers in the surface. The formation of the dimers lowers the surface energy of the nanosheets. Analysis of Mulliken gross populations indicates that there is the charge transfer from the inner part of the nanosheet to the surface. The moving distance and direction of the surface atoms can affect the charge distribution.
机译:通过使用密度函数紧密结合(DFTB)模拟来鉴定超薄Si纳米片厚度对(001)表面形态和电荷分布的影响。 基于键合长度,键合角分布和Si纳米片的表面原子的粘合长度,键角分布和布置图案,阐明了结构和电子性质的差异,其厚度从1.5nm降到0.4nm。 一些纳米液中的表面原子在其二聚体中存在完美的曲折图案。 三聚体的量远小于表面中的二聚体的量。 二聚体的形成降低了纳米片的表面能。 穆利克伦群体分析表明,从纳米晶片的内部到表面的电荷转移。 表面原子的移动距离和方向会影响电荷分布。

著录项

  • 来源
    《Science of advanced materials》 |2021年第3期|389-399|共11页
  • 作者单位

    Shenyang Ligong Univ Sch Sci Shenyang 110159 Peoples R China|Northeastern Univ Key Lab Anisotropy & Texture Mat Minist Educ Shenyang 110819 Peoples R China;

    Shenyang Ligong Univ Sch Sci Shenyang 110159 Peoples R China;

    Shenyang Ligong Univ Sch Sci Shenyang 110159 Peoples R China;

    Northeastern Univ Key Lab Anisotropy & Texture Mat Minist Educ Shenyang 110819 Peoples R China|Northeastern Univ Sch Mat Sci & Engn Shenyang 110819 Peoples R China;

    Northeastern Univ Key Lab Anisotropy & Texture Mat Minist Educ Shenyang 110819 Peoples R China|Northeastern Univ Sch Mat Sci & Engn Shenyang 110819 Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Ultrathin Si Nanosheet; Surface; Computer Simulations; Electronic Properties; Density Functional Tight Binding;

    机译:超薄SI纳秒;表面;计算机仿真;电子特性;密度函数紧绑定;

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