SYNCHROTRON X-RAY TOPOGRAPHY

摘要

The various techniques of X-ray diffraction topography image imperfections in single-crystals by Bragg reflexion, with a spatial resolution of approximately one micrometre. Defects can be studied in relation to crystal growth and physical properties. X-ray interference effects can also be explored in perfect, and nearly perfect, crystals. Synchrotron radiation has given X-ray topography additional powers, including the rapid non-destructive assessment of crystal perfection in materials of industrial importance.