Until recently, correlating on-chip signal integrity and functionality to the actual received signal on a printed circuit board has been difficult for engineers. Because certain points in a circuit are not accessible by standard test equipment, it has been very difficult to diagnose signal integrity or functional problems, with the results often being speculative. Consequently, engineers have relied heavily on computer modeling to gain pseudo-access to unattainable points in the circuit. The combination of a benchtop logic analyzer and a logic analyzer software tool that can easily debug multimillion field programmable gate array (FPGA) designs is now addressing these engineering frustrations. Signals now can be observed simultaneously within an FPGA and on the PCB. This gives engineers access to two points in a circuit―one within the FPGA and one on the PCB―allowing them to quickly diagnose signal integrity and functional issues using empirical results.
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