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首页> 外文期刊>Materials Letters >Fabrication of needle-shaped GaN nanowires by ammoniating Ga_2O_3 films on MgO layers deposited on Si (111) substrates
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Fabrication of needle-shaped GaN nanowires by ammoniating Ga_2O_3 films on MgO layers deposited on Si (111) substrates

机译:通过氨化沉积在Si(111)衬底上的MgO层上的Ga_2O_3膜来制备针状GaN纳米线

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摘要

Needle-shaped GaN nanowires have been synthesized on Si (111) substrate through ammoniating Ga_2O_3/MgO films under flowing ammonia atmosphere at the temperature of 950℃. The as-synthesized GaN nanowires were characterized by X-ray diffraction (XRD), Fourier transformed infrared (FTIR) spectroscopy, scanning electron microscope (SEM) and high-resolution transmission electron microscopy (HRTEM). The results demonstrate that these nanowires are hexagonal GaN and possess a smooth surface with an average diameter about 200 nm and a length ranging from 5 μm to 15 μm. In addition, the diameters of these nanowires diminish gradually. The growth mechanism of crystalline GaN nanowires is discussed briefly.
机译:通过在流动的氨气氛下,在950℃的温度下氨化Ga_2O_3 / MgO薄膜,在Si(111)衬底上合成了针状GaN纳米线。合成后的GaN纳米线通过X射线衍射(XRD),傅立叶变换红外(FTIR)光谱,扫描电子显微镜(SEM)和高分辨率透射电子显微镜(HRTEM)进行表征。结果表明,这些纳米线是六角形的GaN,并具有光滑的表面,其平均直径为约200 nm,长度范围为5μm至15μm。另外,这些纳米线的直径逐渐减小。简要讨论了晶体GaN纳米线的生长机理。

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