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Layer-by-layer deposition of zirconia thin films from aqueous solutions

机译:从水溶液中逐层沉积氧化锆薄膜

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摘要

Thin films of ZrO_2 and Y_2O_3-doped ZrO_2 were deposited using a novel yet simple layer-by-layer technique by means of electrostatic assembling and surface precipitation via dipping substrates alternately in cationic and anionic precursor solutions. Uniform films have been made. A constant growth rate of 5.4±0.3 nm per deposition cycle for the dehydrated nanocrystalline films was achieved. This generic technique can be adapted to make other oxide films and novel multilayers or functionally-graded coatings.
机译:ZrO_2和Y_2O_3掺杂的ZrO_2薄膜通过静电组装和表面沉淀法,通过将基体交替浸入阳离子和阴离子前体溶液中,采用新颖而简单的逐层技术沉积。已经制作了均匀的膜。脱水纳米晶体膜的每个沉积循环的恒定生长速率为5.4±0.3 nm。这种通用技术可以适用于制造其他氧化物膜和新型多层或功能梯度涂层。

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