Analysis of Pulsed Thermography Methods for Defect Depth Prediction

摘要

Pulsed thermography is an effective technique for quantitative prediction of defect depth within a specimen. Several methods have been reported in the literature. In this paper, using an analysis based on a theoretical one-dimensional solution of pulsed thermography, we analyzed four representative methods. We show that all of the methods are accurate and converge to the theoretical solution under ideal conditions. Three methods can be directly used to predict defect depth. However, because defect features that appear on the surface during a pulsed thermography test are always affected by three-dimensional heat conduction within the test specimen, the performance and accuracy of these methods differs for defects of various sizes and depths. This difference is demonstrated and evaluated from a set of pulsed thermography data obtained from a specimen with several flat-bottom holes as simulated defects.