Patent Issued for Fluorescence Analyzing Device and Fluorescence Analyzing Method

摘要

2013 MAR 20 (VerticalNews) -- By a News Reporter-Staff News Editor at Journal of Engineering --nAccording to news reporting originating from Alexandria, Virginia, by VerticalNews journalists, a patent bynthe inventors Takahashi, Satoshi (Hitachinaka, JP); Sonehara, Tsuyoshi (Kokubunji, JP); Sakai,nTomoyuki (Kokubunji, JP); Haga, Takanobu (Kokubunji, JP); Kato, Hirokazu (Mito, JP); Kumazaki,nNobutaka (Hitachinaka, JP); Matsui, Takuya (Mito, JP), filed on November 30, 2009, was cleared andnissued on March 5, 2013.