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Unusual Increase of Electron Thermal Conductivity Caused by a Pseudogap at the Fermi Level

机译:在费米能级上由假多普引起的电子热导率异常增加

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摘要

At high temperatures above 200 K, a significant increase in thermal conductivity, κ(T), was observed for the Al-based complex structure alloys, Al82.6−x Re17.4Si x and Al82.6−x Mn17.4Si x (7 ≤ x ≤ 11), in which 138 atoms exist in a large cubic unit cell with a lattice constant of a ≈ 1.2 nm. By analyzing the measured κ(T) in terms of the electronic density of states determined both by the low-temperature specific heat measurement and a band calculation, we found that the increase in κ(T) at high temperatures is most pronounced when the Fermi level (Ɛ F) is located at the local minimum of the electronic density of states (pseudogap). The behavior of κ(T) at high temperature is almost quantitatively accounted for using the linear response theory with the theoretically calculated electronic density of states. These facts unambiguously indicate that the large increase in κ(T) is not brought about by the lattice but by the electrons in the pseudogap persisting at Ɛ F.
机译:在高于200 K的高温下,观察到Al 82.6−x Re 17.4 的Al基复杂结构合金的导热系数κ(T)显着增加。 Si x 和Al 82.6−x Mn 17.4 Si x (7≤x≤11),其中138原子存在于具有约1.2 nm晶格常数的大型立方晶胞中。通过根据低温比热测量和能带计算确定的态的电子密度分析测量的κ(T),我们发现,当费米合金在高温下,κ(T)的增加最为明显。能级(Ɛ F )位于状态电子密度(pseudogap)的局部最小值。 κ(T)在高温下的行为几乎是使用线性响应理论和理论计算的电子态密度来定量地说明的。这些事实清楚地表明,κ(T)的大幅增加不是由晶格引起的,而是由伪间隙中的电子持续存在于 F 引起的。

著录项

  • 来源
    《Journal of Electronic Materials》 |2009年第7期|p.1354-1359|共6页
  • 作者

    Tsunehiro Takeuchi;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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