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Growth and characterization of Hexakis(thiourea)nickel(II) nitrate crystals

机译:六(硫脲)硝酸镍(II)晶体的生长和表征

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Single crystals of hexakis(thiourea)nickel(II) nitrate [Ni(SC(NH_2)_2)_6](NO_3)_2 are grown by slow evaporation of methanolic solution at room temperature. Structural analysis by single crystal X-ray diffraction analysis reveals that the crystal belongs to monoclinic system with space group C2/c and the cell parameters are α=22.046(2) A, b=9.3325(4)A, c=16.221(2) A, Z=8. The metal is coordinated by six thiourea groups with Ni-S-C bond angles ranging from 114.81° to 116.85° and Ni-S bond lengths lying in the range 2.35 to 2.61 A in a distorted octahedral geometry. The interesting feature observed in this study is that although it crystallizes in centrosymmetric structure, contrary to expectations, it exhibits a positive second harmonic generation (SHG) result, quite likely due to the change in stereochemical arrangement. An Nd:YAG laser with a modulated radiation of 1064nm directed on the powdered sample leads to local noncentrosymmetry and this could be due to the loss of thiourea ligands resulting in tetrakis(thiourea)nickel(II) complex causing green light emission. The powder X-ray diffraction study reveals the crystallinity of the grown material. The vibrational patterns in FT-IR clearly evidence the complex formation. Thermogravimetric analysis (TG) reveals the purity of the sample and no decomposition is observed up to the melting point. The crystal is further characterized by diffused reflectance spectroscopy, dielectric studies and microhardness analysis.
机译:硝酸六(硫脲)镍(II)镍[Ni(SC(NH_2)_2)_6](NO_3)_2的单晶通过在室温下缓慢蒸发甲醇溶液来生长。 X射线衍射分析表明,该晶体属于单斜晶系,空间群为C2 / c,晶胞参数为α= 22.046(2)A,b = 9.3325(4)A,c = 16.221(2) )A,Z = 8。金属由六个硫脲基团配位,Ni-S-C键角范围从114.81°到116.85°,且Ni-S键长在变形的八面体几何结构中在2.35至2.61 A的范围内。在这项研究中观察到的有趣特征是,尽管它结晶为中心对称结构,但与预期相反,但由于立体化学排列的变化,它显示出正的二次谐波生成(SHG)结果。指向粉末样品的Nd:YAG激光具有1064nm的调制辐射,导致局部非中心对称性,这可能是由于硫脲配体的损失导致四(硫脲)镍(II)配合物丢失而导致绿色发光。粉末X射线衍射研究揭示了生长材料的结晶度。 FT-IR中的振动模式清楚地证明了复合物的形成。热重分析(TG)揭示了样品的纯度,直至熔点仍未观察到分解。晶体的特征还在于漫反射光谱,介电研究和显微硬度分析。

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