Rearrangement of Multiferroic BiFeO_3 Nanodots Smaller than 15 nm Using Atomic Force Microscopy

摘要

In this study, we demonstrate an atomic force microscopy process for manipulating multiferroic BiFeO_3 nanodots smaller than 15 nm to desired positions on a Nb-doped SrTiO_3 substrate. For formation of the BiFeO_3 nanodot array, nanocrys-tal movement was achieved using a +1.2 V biased conducting atomic force microscopy (CAFM) followed by nanocrystal attachment to the tip. Using this method, high-density BiFeO_3 nanodot arrays with a density greater than 0.5 Tb/in. can be achieved. Perfectly flipped ferroelectric polarization with an external electric field was observed for each BiFeO_3 nanodot, whose ferroelectric properties were confirmed using piezoelectric force microscopy.