首页> 外文期刊>Japanese journal of applied physics >Nonvolatile Power-Gating Field-Programmable Gate Array Using Nonvolatile Static Random Access Memory and Nonvolatile Flip-Flops Based on Pseudo-Spin-Transistor Architecture with Spin-Transfer-Torque Magnetic Tunnel Junctions
【24h】

Nonvolatile Power-Gating Field-Programmable Gate Array Using Nonvolatile Static Random Access Memory and Nonvolatile Flip-Flops Based on Pseudo-Spin-Transistor Architecture with Spin-Transfer-Torque Magnetic Tunnel Junctions

机译:基于自旋转矩磁隧道结的伪自旋晶体管架构的非易失性静态随机存取存储器和非易失性触发器的非易失性门控现场可编程门阵列

获取原文
获取原文并翻译 | 示例
           

摘要

We proposed and computationally analyzed a nonvolatile power-gating field-programmable gate array (NVPG-FPGA) based on pseudo-spin-transistor architecture with spin-transfer-torque magnetic tunnel junctions (STT-MTJs). The circuit employs nonvolatile static random memory (NV-SRAM) cells and nonvolatile flip-flops (NV-FFs) as the storage circuits of the NVPG-FPGA. The circuit configuration and microarchitecture are compatible with SRAM-based FPGAs, and the additional nonvolatile memory functionality makes it possible to execute efficient power gating (PG). The break-even time (BET) for the nonvolatile configuration logic block (NV-CLB) of the NVPG-FPGA was also analyzed, and reduction techniques of the BET, which allows highly efficient PG operations with fine granularity, were proposed.
机译:我们提出并基于伪自旋晶体管架构与自旋转移转矩磁隧道结(STT-MTJs)提出了非易失性功率门控现场可编程门阵列(NVPG-FPGA)。该电路采用非易失性静态随机存储器(NV-SRAM)单元和非易失性触发器(NV-FF)作为NVPG-FPGA的存储电路。电路配置和微体系结构与基于SRAM的FPGA兼容,附加的非易失性存储器功能使执行高效的电源门控(PG)成为可能。还分析了NVPG-FPGA的非易失性配置逻辑块(NV-CLB)的收支平衡时间(BET),并提出了BET减少技术,该技术可实现具有精细粒度的高效PG操作。

著录项

  • 来源
    《Japanese journal of applied physics》 |2012年第11issue2期|11PB02.1-11PB02.5|共5页
  • 作者单位

    Department of Information Processing, Tokyo Institute of Technology, Yokohama 226-8502, Japan,CREST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan;

    Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan,CREST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan;

    Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan,CREST, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号