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Al-Zn-Sn-O Thin Film Transistors with Top and Bottom Gate Structure for AMOLED

机译:具有顶部和底部栅极结构的用于AMOLED的Al-Zn-Sn-O薄膜晶体管

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摘要

We have fabricated the transparent bottom gate and top gate TFTs using new oxide material of Al-Zn-Sn-0 (AZTO) as an active layer. The AZTO active layer was deposited by RF magnetron sputtering at room temperature. Our novel TFT showed good TFT performance without post-annealing. The field effect mobility and the sub-threshold swing were improved by the post-annealing, and the mobility increased with SnO_2 content. The AZTO TFT (about 4 mol% AlOx, 66 mol% ZnO, and 30 mol% SnO_2) exhibited a mobility of 10.3 cm~2/Vs, a turn-on voltage of 0.4 V, a sub-threshold swing of 0.6 V/dec, and an on/off ratio of 10~9. Though the bottom gate AZTO TFT showed good electrical performance, the bias stability was relatively poor. The bias stability was significantly improved in the top gate AZTO TFT. We have successfully fabricated the transparent AMOLED panel using the back-plane composed with top gate AZTO TFT array.
机译:我们使用新的Al-Zn-Sn-0(AZTO)氧化物材料作为有源层,制造了透明的底栅和顶栅TFT。在室温下通过RF磁控溅射沉积AZTO活性层。我们的新型TFT在不进行后退火的情况下表现出良好的TFT性能。后退火提高了场效应迁移率和亚阈值摆幅,并且随着SnO_2含量的增加,迁移率增加。 AZTO TFT(约4 mol%AlOx,66 mol%ZnO和30 mol%SnO_2)的迁移率为10.3 cm〜2 / Vs,开启电压为0.4 V,亚阈值摆幅为0.6 V / dec,开/关比为10〜9。尽管底栅AZTO TFT显示出良好的电性能,但偏置稳定性相对较差。偏置稳定性在顶栅AZTO TFT中得到了显着改善。我们已经成功地使用由顶栅AZTO TFT阵列组成的背板成功制作了透明AMOLED面板。

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