FOREWORD

摘要

Thanks to the continuous advancement in CMOS device scaling, system LSIs has achieved a great performance enhancement. The leakage current increased by CMOS device scaling is the one of the performance-limiting factors not only for mobile LSIs but also for high-speed LSIs. In addition, a low-voltage operation of these LSIs is hindered by increase of device variation. With an application of system LSIs to ubiquitous devices, low-power, high-speed technologies are in greater demand than ever before. This special section contains 1 letter and 16 regular papers.