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Power Loss Model for GaN-Based MHz Critical Conduction Mode Power Factor Correction Circuits

机译:基于GaN的MHz临界传导模式功率因数校正电路的功率损耗模型

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摘要

Wide bandgap (WBG) devices allow power factor correction (PFC) circuits to operate at megahertz (MHz), which improves power density. In low-power applications, critical conduction mode (CrM) boost PFC circuits are widely used due to its simple structure and minimized turn-on loss. Compared with the kilohertz (kHz) operation, MHz PFC in CrM yields larger inductor valley current during the zero voltage or valley switching turn-on, and significant grid current zero-crossing distortion, both of which are not considered in conventional PFC behavioral models. As a result, the conventional PFC design tool shows substantial inaccuracy in the estimation of switching frequency, inductor current envelopes, and power loss. This article analyzes these issues and proposes an improved power loss model to aid the design of MHz CrM PFC. Experimental results are presented to validate the accuracy.
机译:宽带隙(WBG)器件允许功率因数校正(PFC)电路在MegaHertz(MHz)上运行,从而提高功率密度。在低功耗应用中,临界传导模式(CRM)升压PFC电路由于其简单的结构而被广泛使用,并且最小化导通损耗。与千赫兹(kHz)操作相比,CRM中的MHz PFC在零电压或谷开关导通期间产生更大的电感谷电流,并且在传统的PFC行为模型中不考虑其两者的显着电网电流零交叉失真。结果,传统的PFC设计工具在开关频率,电感器电流信封和功率损耗的估计中显示出实质性不准确性。本文分析了这些问题,提出了一种改进的功率损耗模型,以帮助设计MHz CRM PFC。提出了实验结果以验证准确性。

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