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Power bumps and through-silicon-vias placement with optimised power mesh structure for power delivery network in three-dimensional-integrated circuits

机译:具有优化电源网格结构的电源凸点和硅通孔布局,用于三维集成电路中的电源传输网络

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摘要

Three-dimensional-integrated circuits (3D-ICs) bring new issues for power delivery network design because of larger current density and more complicated power delivery paths compared to 2D-IC. The power delivery network consists of power bumps, through-silicon-vias (TSVs), and power wires. IR-drop at each node varies with the number and position of power bumps and TSVs. These three power resources affect IR-drop of 3D-ICs. In this study, the authors propose power delivery network design methodology to optimise power resources wherease IR-drop constraint is satisfied. The simulation results show that the proposed method minimises the number of power bumps and TSVs compared to the conventional method.
机译:三维集成电路(3D-IC)给功率传输网络设计带来了新问题,因为与2D-IC相比,电流密度更大且功率传输路径更复杂。供电网络由电源凸块,硅通孔(TSV)和电源线组成。每个节点的IR压降随功率凸点和TSV的数量和位置而变化。这三种电源会影响3D-IC的IR下降。在这项研究中,作者提出了一种电力输送网络设计方法,以优化满足IR压降约束的电力资源。仿真结果表明,与传统方法相比,该方法最大程度地减少了功率凸点和TSV的数量。

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