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A critical study of the optical and electrical properties of transparent and conductive Mo-doped ZnO films by adjustment of Mo concentration

机译:通过调节Mo浓度对透明导电Mo掺杂ZnO薄膜的光学和电学性质的严格研究

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Mo-doped zinc oxide (ZnO: Mo) transparent conductive thin films were prepared on the glass substrates using simple chemical spray pyrolysis technique by varying the Mo doping concentration in the range, 0-5 at.% at a constant substrate temperature, 400 degrees C. The effect of Mo-doping concentration on the physical behavior of ZnO films was investigated. The X-ray Photoelectron Spectroscopy (XPS) analysis confirmed the presence of Zn, O, and Mo in the layers with Mo in +6 state. The X-ray diffraction (XRD) patterns exhibited hexagonal wurtzite crystal structure without any secondary phases. The microstructural analysis revealed the spherical nut-shaped grains over the substrate surface. The optical studies revealed that the films with Mo-doping concentration of 2 at.% showed high optical transmittance and a wide band gap than pure and highly Mo-doped ZnO films. From the optical transmittance versus wavelength data, the refractive index, extinction coefficient, dispersion constants were evaluated. In addition, other optical parameters such as the optical conductivity, dielectric constants, dissipation factor, electron energy loss functions and Haze were also calculated. The FTIR studies revealed the presence of modes related to ZnO. Finally the electrical parameters such as resistivity, charge carrier mobility and density of ZnO: Mo films were also analyzed and presented.
机译:使用简单的化学喷雾热解技术,通过在恒定的基板温度,400度下将Mo掺杂浓度在0-5 at。%的范围内变化,在玻璃基板上制备Mo掺杂的氧化锌(ZnO:Mo)透明导电薄膜。 C.研究了Mo掺杂浓度对ZnO薄膜物理行为的影响。 X射线光电子能谱(XPS)分析证实,在Mo处于+6状态的层中存在Zn,O和Mo。 X射线衍射(XRD)图样显示六方纤锌矿晶体结构,没有任何第二相。显微组织分析表明,在基底表面上有球形螺母状晶粒。光学研究表明,与纯高Mo掺杂的ZnO薄膜相比,Mo掺杂浓度为2 at。%的薄膜具有较高的透光率和宽带隙。从透光率对波长的数据,评估折射率,消光系数,色散常数。此外,还计算了其他光学参数,如光导率,介电常数,耗散因数,电子能量损失函数和雾度。 FTIR研究表明存在与ZnO相关的模式。最后,还对ZnO:Mo薄膜的电阻率,电荷迁移率和密度等电学参数进行了分析和介绍。

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