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Effect of ferroelectric domain walls on the dielectric properties of PbZrO_3 thin films

机译:铁电畴壁对PBZRO_3薄膜介电性能的影响

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摘要

In antiferroelectric PbZrO_3 thin films, a weak residual ferroelectric phase is often observed on the double hysteresis loop and it is important to know its impact on the dielectric properties. To study this residual phase, a low and homogeneous electric field can be used because antiferroelectric domain walls are not sensitive to homogeneous fields; thus, contributions of ferroelectric domain wall motions to permittivity and dielectric losses can be isolated. In this paper, the hyperbolic law characterization is used on lead zirconate thin films, which present a residual ferroelectric phase. The study shows that domain wall contributions of the ferroelectric phase are small (less than 2% of the total permittivity), but their impacts are very important in the overall dielectric losses (≈26%). These losses are, however, lower than those obtained in pure ferroelectric materials due to a residual state composed of well distributed ferroelectric clusters of small size with no interactions between domain walls.
机译:在防火电池PBZRO_3薄膜中,通常在双磁滞回路上观察到弱残余铁电相,并且重要的是知道其对电介质性质的影响。为了研究这种剩余相,可以使用低和均匀的电场,因为防火电畴壁对均匀田地不敏感;因此,可以分离铁电畴壁运动对介电常数和介电损耗的贡献。在本文中,双曲线法表征用于铅锆型薄膜,其呈现残余铁电相。该研究表明,铁电相的域壁贡献小(占总介电常数的占2%),但它们的影响在整体介电损失中非常重要(≈26%)。然而,这些损失低于纯铁电材料中获得的损失,由于由分布的小尺寸的良好分布的铁电簇组成,并且在畴壁之间没有相互作用。

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  • 来源
    《Applied Physics Letters》 |2020年第14期|142905.1-142905.4|共4页
  • 作者单位

    IETR UMR CNRS 6164 University of Nantes 2 Rue de la Houssiniere 44322 Nantes France;

    IETR UMR CNRS 6164 University of Nantes 2 Rue de la Houssiniere 44322 Nantes France;

    IETR UMR CNRS 6164 University of Nantes 2 Rue de la Houssiniere 44322 Nantes France;

    IETR UMR CNRS 6164 University of Nantes 2 Rue de la Houssiniere 44322 Nantes France;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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