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Temperature-dependent current-voltage characteristics of β-Ga_2O_3 trench Schottky barrier diodes

机译:β-GA_2O_3沟槽肖特基屏障二极管的温度依赖性电流 - 电压特性

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摘要

Temperature-dependent behavior of regular and trench Ni/β-Ga_2O_3 (001) Schottky barrier diodes (SBDs) was studied. Current-Voltage (Ⅰ-Ⅴ) characteristics, ideality factor, and barrier height of trench SBDs were compared with those of regular SBDs at temperatures ranging from 100 K to 650 K. The trench SBDs showed a superior performance to regular SBDs. At elevated temperatures (as high as 650 K), the trench SBDs maintained a high ON/OFF current ratio (10~5), which is four orders of magnitude higher than that in the regular diodes. The current-voltage characteristics of the trench SBDs were recovered when the sample was cooled to room temperature after high temperature measurements, whereas the I-V characteristics of the regular SBDs were degraded. The breakdown voltage (BV) was also measured on as-fabricated devices and after high temperature ramp up to 650 K. We observed a reduction in maximum achieved BV from 1084 Ⅴ to 742 Ⅴ on the trench SBDs and from 662 Ⅴ to 488 Ⅴ on regular SBDs, respectively, after temperature-dependent measurements.
机译:研究了常规和沟槽Ni /β-Ga_2O_3(001)肖特基势垒二极管(SBD)的温度依赖性行为。将沟槽SBD的电流电压(Ⅰ-ⅴ)特性,理想因子和屏障高度与常规SBD的温度范围从100 k到650 K的温度进行比较。沟槽SBD显示出常规SBD的优异性能。在升高的温度(高达650 k)时,沟槽SBD保持高/关闭电流比(10〜5),这是比常规二极管高的四个数量级。当样品在高温测量后将样品冷却至室温时,回收沟槽SBD的电流 - 电压特性,而常规SBD的I-V特性降低。击穿电压(BV)还测量了以制造的装置测量,高温斜坡高达650 K.我们观察到在沟槽SBD上的最大BV的最大值降低,并从沟槽SBD上的662‰到488°ach经过温度依赖性测量,分别常规SBD。

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  • 来源
    《Applied Physics Letters》 |2020年第15期|152104.1-152104.5|共5页
  • 作者单位

    Department of Electrical Engineering and Computer Science University of Michigan Ann Arbor Michigan 48109 USA;

    Department of Electrical Engineering and Computer Science University of Michigan Ann Arbor Michigan 48109 USA;

    Department of Electrical Engineering and Computer Science University of Michigan Ann Arbor Michigan 48109 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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