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High electrical conducting deep-ultraviolet- transparent oxide semiconductor La-doped SrSnO_3 exceeding ~3000 S cm~(-1)

机译:高导电深紫外透明氧化物半导体La掺杂SrSnO_3超过〜3000 S cm〜(-1)

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摘要

La-doped SrSnO3 (LSSO) is known as one of the deep-ultraviolet (DUV)-transparent conducting oxides with an energy bandgap of similar to 4.6 eV. Since LSSO can be grown heteroepitaxially on more wide bandgap substrates such as MgO (E-g similar to 7.8 eV), LSSO is considered to be a good candidate for a DUV-transparent electrode. However, the electrical conductivity of LSSO films is below 1000 S cm(-1), most likely due to the low solubility of the La ion in the LSSO lattice. Here, we report that high electrically conducting (>3000 S cm(-1)) LSSO thin films with an energy bandgap of similar to 4.6 eV can be fabricated by pulsed laser deposition on a MgO substrate followed by a simple annealing in vacuum. From the X-ray diffraction and the scanning transmission electron microscopy analyses, we found that lateral grain growth occurred during the annealing, which improved the activation rate of the La ion, leading to a significant improvement of the carrier concentration (3.26 x 10(20) cm(-3)) and Hall mobility (55.8 cm(2) V-1 s(-1)). The present DUV-transparent oxide semiconductor would be useful as a transparent electrode for developing optoelectronic devices, which transmit and/or emit DUV-light.
机译:掺La的SrSnO3(LSSO)是一种深紫外(DUV)透明的导电氧化物,其能带隙接近4.6 eV。由于LSSO可以异质外延生长在更宽的带隙衬底上,例如MgO(E-g类似于7.8 eV),因此LSSO被认为是DUV透明电极的良好候选者。但是,LSSO薄膜的电导率低于1000 S cm(-1),最可能是由于La离子在LSSO晶格中的溶解度低。在这里,我们报告可以通过在MgO衬底上进行脉冲激光沉积,然后在真空中进行简单退火,来制造能带隙接近4.6 eV的高导电(> 3000 S cm(-1))LSSO薄膜。通过X射线衍射和扫描透射电子显微镜分析,我们发现在退火过程中发生了横向晶粒长大,从而提高了La离子的活化速率,从而导致载流子浓度显着提高(3.26 x 10(20 )cm(-3))和霍尔迁移率(55.8 cm(2)V-1 s(-1))。本DUV透明氧化物半导体将可用作用于开发透射和/或发射DUV光的光电器件的透明电极。

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  • 来源
    《Applied Physics Letters》 |2020年第2期|022103.1-022103.5|共5页
  • 作者单位

    Hokkaido Univ Grad Sch Informat Sci & Technol Kita Ku N14W9 Sapporo Hokkaido 0600814 Japan;

    Hokkaido Univ Res Inst Elect Sci Kita Ku N20W10 Sapporo Hokkaido 0010020 Japan;

    Univ Tokyo Inst Engn Innovat Bunkyo Ku 2-11-6 Yayoi Tokyo 1138656 Japan;

    Hokkaido Univ Grad Sch Informat Sci & Technol Kita Ku N14W9 Sapporo Hokkaido 0600814 Japan|Hokkaido Univ Res Inst Elect Sci Kita Ku N20W10 Sapporo Hokkaido 0010020 Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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