Coherently strained epitaxial YBa_2Cu_3O_(7_δ) films grown on NdGaO_3 (110)

摘要

YBa2Cu3O7-delta is a good candidate to systematically study high-temperature superconductivity by nanoengineering using advanced epitaxy. An essential prerequisite for these studies is coherently strained YBa2Cu3O7-delta thin films, which we present here using NdGaO3 (110) as a substrate. The films are coherent up to at least 100 nm thickness and have a critical temperature of 89 +/- 1 K. The a and b lattice parameters of YBa2Cu3O7-delta are matched to the in-plane lattice parameters of NdGaO3 (110), resulting in a large reduction of the orthorhombicity of YBa2Cu3O7-delta. These results imply that a large amount of structural disorder in the chain layers of YBa2Cu3O7-delta is not detrimental to superconductivity. Published by AIP Publishing.